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    • Compact, air-cooled OEM style
    • Superior pulse repeatability
    • Simple parallel operation for higher power
    • Optional Active PFC (pf = 0.98)
    • Full remote control interface
    • High EMI-RFI immunity

     

    • Advanced semiconductor technology
    • High-quality construction
    • Rapid capacitor and pulse-forming network charging
    • Compact and lightweight design
    • Simple parallel operation for higher power needs
    • Compatible with worldwide input voltages and frequencies
    • Fully adjustable output voltage
    • Comprehensive remote control interface

     

  • High-Speed Current Control: No dynamic overshoot or oscillation
    High Slew-Rate: Up to 30A/*s for fast load changes
    Low Voltage Operation: Stable operation with no turn-on delay
    Multi-Functional: Seven load modes and four operating modes
    Parallel Operation: Up to 10kW with 10 units
    User-Friendly Interface: Built-in USB and optional IEEE interfaces
    Compliance: EN61010-1 compliant with a two-year warranty

    • Dynamic set up: During a simple frame reading, users can define elements to be acquired, recorded, visualized and surveyed in real time.
    •  Macro-command: Users can write and execute complex test sequences thanks to macro-command functions.
    •  Local & Distant Integration: AT-DIAG can be driven and interrogated by external software. It can also be used with a computer through Ethernet.
    • Communication ports: Communication is done through RS232, NI CAN acq. Card, specific acquisition card or system.
    •  Protocols: FREERUNNING, KWP2000, CAN, LIN, FlexRay, ARINC, … Possibility to implement new protocols (customized protocol, …).
    •  Multi-product & Multi-protocol Communication: Communication can be set up with multiple addresses and protocols during a single test.

     

    • 1 software for all your equipment
    • 1 software for all standards
    • 1 software for your electrical and EMC tests
    • Advanced functions of monitoring and control
    • Automated reports
    • Team of specialists at your disposal

     

    • Fast: ACA compression and parallelization allow to speed up the calculation
    • Accurate: Fully validated with measurement results on real mock-up
    • Innovative: New method from research labs
    • Powerful: Compute very large models
    • Easy: Dedicated graphical user interface with modern layout

     

    • Fast: ACA compression and parallelization allow to speed up the calculation
    • Accurate: Fully validated with measurement results on real mock-up
    • Innovative: New method from research labs
    • Powerful: Compute very large models
    • Easy: Dedicated graphical user interface with modern layout

     

    • Unique user interface for all tests
    • Independent from any measuring device manufacturers
    • Free drivers and over 500 supported devices
    • Efficient and dedicated Technical support
    • Wide range of supported standards (ENxx, CISPR, AUTOMOTIVE, DO160, …)
    • Interface Agilent VEE™, WindowsLabView™, LabWindows CVI™, Visual C++
    • Operating system: Win XP, Vista, Seven, Windows 8
    • Report in MS Office™ 2003, 2007, 2010, 2013, Open office

     


Showing all 8 results