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• Versatile Current Sensing: Accurately measure small and large currents, from sub-milliamp levels to thousands of amps.
• High-Speed Pulse Monitoring: Patented distributed termination technology enables ultra-fast rise time measurement (as short as 2ns).
• Enhanced Noise Immunity & Safety: Double shielding minimizes external noise, making these monitors ideal for high-voltage applications.
• Robust Construction: Sealed models are suitable for high-voltage insulating oil or vacuum environments.
• Broad Compatibility: Works with oscilloscopes, spectrum analyzers, power analyzers, digital voltmeters, ADCs, and more.

High-Precision Current Measurement with BNC Connectivity

• Precision Current Sensing: ±1% accuracy ensures reliable real-time current monitoring.
• BNC Connector for Seamless Connectivity: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
• Clamp-On Design for Non-Intrusive Measurement: Safely monitor live current flow without circuit disruption.
• 50 Ohm Termination Compatible: Output reduces by half when using a 50Ω termination.
• High-Voltage Safety Considerations: Conductive case requires adequate insulation for user safety.

High-Precision Current Sensing with BNC Connectivity

• High-Precision Measurement: ±1% accuracy for reliable current sensing.
• Customizable Configurations: Designed to meet specific user requirements for precision measurement.
• BNC Connector for Easy Integration: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
• Non-Insulated Conductive Case: Proper insulation must be provided on the monitored conductor.
• 50 Ohm Termination Compatibility: Using a 50Ω termination reduces the output to half.

High-Precision Voltage Measurement Up to 500kV

• High-Voltage Measurement Capability: Supports up to 500kV in insulating oil and customizable calibration for air use.
• Precision Division Ratios: Models with 5000:1, 10,000:1, and custom ratios, ensuring reliable voltage scaling.
• Temperature-Compensated Accuracy: ±1% over 20°C to 80°C, providing stable voltage readings.
• Robust Design for Harsh Environments: Sealed for high-voltage insulating oil use, with custom air calibration available.
• Safe Operation with Ground Loop Control: The outer conductor is isolated from the case, allowing controlled grounding connections.

Precision Pulse Output Up to 500kV

• Wide Voltage Range: Supports 100kV to 500kV pulse outputs for high-energy applications.
• Fast Pulse Transmission: Pulse durations from 0.25 to 50 microseconds, ensuring efficient energy transfer.
• Insulating Oil Immersion: Open-construction design for operation in high-voltage insulating oil, reducing breakdown risks.
• Advanced Overvoltage Protection: Designed with built-in safety factors (50-100%) to prevent damage from overvoltages.
• Reliable Flashover Protection: Corona ring-to-core insulation prevents damage from accidental flashovers.

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact

Contact Intelligence

• Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.