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Multi-Range DC Power Supply with digital control, 3 or 4 Outputs, 315 to 420W with/without Remote Interfaces

• hree or four high performance outputs each with full functionality
• Range switching gives variable voltage/current combinations
• Shared power mode provides double power from a single output
• Low output noise and ripple via linear final regulation
• High setting resolution of up to 1mV and 0.1mA
• Variable OVP and OCP trips on all outputs
• 50 setting memories per output plus 50 linked memories
• Selectable voltage tracking (isolated tracking)
• Selectable current meter averaging
• Switchable remote sense capability
• Graphic LCD provides simultaneous output metering
• Numeric or spin-wheel control of all parameters
• Individual or combined output on/off control with programmable delay sequencing.
• 3U half-rack case for bench or rack mounting (4U rack kit accessory available)
• RS-232, USB and LAN (LXI) interfaces (P models), GPIB option
• Duplicate power & sense terminals at rear (P models)

with 10MHz to 3.6 or 6.0GHz bandwidth options

True hand-held battery powered RF spectrum analyzers.

• 10MHz to 3600MHz or 6000MHz frequency range
• Resolution bandwidths from 300Hz to 10MHz (1:3:10)
• -120dBm typical noise floor at -40dBm ref. level/10kHz RBW
• Measurement in dBm or dBµV, mV or µW
• Zero span mode with AM and FM audio demodulation
• Trace modes of normal, peak hold and trace average
• Live, View and Reference traces in contrasting colours
• Twin markers with readout of absolute & difference values
• Smart marker movement with selectable peak tracking
• Frequency counter with down to 10Hz resolution
• Frequency presets and independent state storage
• Auto-find automatically sets sweep parameters for the highest signal found
• Unlimited storage for waveforms, set-ups and screens
• User assignable file names, file stamping from real-time clock
• USB interfaces for Flash drives and PC connection
• Comprehensive status and context sensitive help screens
• Rechargeable lithium ion battery giving more than 3 hours continuous operation from a charge
• Smaller and lighter than other spectrum analyzers (weight only 0.56 kg)

DC Power Supply single output, 80V/50A 750W PowerFlex+, LAN & USB interfaces, GPIB Option

• Wide range of voltage/current combinations
• Up to 80V and up to 50A within the same power envelope
• Low output ripple and noise of <3mV rms at full power
• High setting resolution of 1mV
• Analogue control interfaces for voltage and current
• Bench or rack mounting, front and rear terminals
• LAN (LXI), USB, GPIB interfaces (GPIB optional on QPX750SP)

• 150kHz to 3GHz (TGR2053) and 150kHz to 1.5GHz (TGR2051) frequency range
• High signal purity, phase noise <-117dBc/Hz (typical) at 1GHz output and 10kHz offset
• Amplitude range of -127dBm to +13dBm
• 0.1dBm amplitude setting resolution
• Internal or external analogue modulations (AM, FM, PM)
• Amplitude can be set in dBm, dBμV or in linear Volts.
• Internal or external digital modulations – ASK, OOK, FSK, 3FSK, 4FSK, GFSK, MSK, GMSK, HMSK & PSK with U01 option
• Modulation Synchronisation
• Fast amplitude and/or frequency sweeps with comprehensive triggering
• 5ms sweep settling time
• 1ppm frequency accuracy, <1ppm drift in first year
• Modulation waveform output on the rear panel
• Internal waveforms include: Sine, Square, Ramp, Triangle, PRBS (various lengths) and user-defined pattern
• Simple operation with the colour touch screen
• Programmable via USB, LAN (LXI) and GPIB (optional), SCPI compatible
• Compatible with previous Aim-TTi RF generators

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact

Contact Intelligence

• Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

• Highest accuracy with backlash-free positioning
• Drift-free measurements over temperature and time*
• Easy, and safe swapping between arms
• Best signal integrity using optimized probe cabling systems
• Full thermal capability*
• Manual or progammable